This article looks at the potential impact that availability of fewer test pins has on test quality and cost, and how one company, Wolfson Microelectronics, is using new technology in Synopsys’ DFTMAX ...

By using scan, you can make the device itself responsible for some of the “test” chores, and you can shorten the time needed for automatic test pattern generation. The key to setting up a successful ...

We can accomplish this by using data from existing designs and solving a system of linear equations or using linear regression analysis. Ideally, we would have historical test cost data from prior ...

Embedded test compression helps, but using VersaPoint test point technology results in 46X compression ration over what is possible with Tessent TestKompress alone. To read more, click here.

ASTM D 695 1, “Compressive Properties of Rigid Plastics,” defines the end-loading compression test method familiar to the composites community. It was introduced by ASTM Committee D20-Plastics more ...